Profile® Nano Depth Filter Cartridge

For CMP Applications in Microelectronics

Profile Nano advanced depth filter cartridges are high-performance slurry filters that classify ceria and low solids colloidal silica slurries. They are used in chemical mechanical planarization (CMP) processes such as shallow trench isolation (STI) and barrier copper.

Order Products

Product Type

Filter Cartridges

1NC40A

Product ID: 1NC40A
Unit of Measure
20/EA
Min Order Qty
20

1P20U

Product ID: 1P20U
Unit of Measure
20/EA
Min Order Qty
20

1P30A

Product ID: 1P30A
Unit of Measure
20/EA
Min Order Qty
20

This product is currently not available. Please contact us for more information.

1P30U

Product ID: 1P30U
Unit of Measure
20/EA
Min Order Qty
20

1P30U-1PK

Product ID: 1P30U1PK
Unit of Measure
20/EA
Min Order Qty
20

This product is currently not available. Please contact us for more information.

1U10U-1PK 346

Product ID: 1U10U1PK346
Unit of Measure
60/EA
Min Order Qty
60

200NC30U

Product ID: 200NC30U
Unit of Measure
20/EA
Min Order Qty
20

20C30A-EA

Product ID: 20C30AEA
Unit of Measure
20/EA
Min Order Qty
20

20IN 10UM CODE 8

Product ID: 20IN10UMCODE8
Unit of Measure
1/EA
Min Order Qty
1

20IN 5UM CODE 8

Product ID: 20IN5UMCODE8
Unit of Measure
1/EA
Min Order Qty
1

20IN 1UM CODE 8

Product ID: 20IN1UMCODE8
Unit of Measure
1/EA
Min Order Qty
1

20IN 1UM DOE

Product ID: 20IN1UMDOE
Unit of Measure
1/EA
Min Order Qty
1

Description

Why choose Profile Nano depth filter cartridges for CMP applications?

 

These CMP filters efficiently remove particles as fine as 100 nm with the help of extremely fine fibers manufactured via a highly advanced melt-blowing process.

 

Additional benefits include:

 

  • High removal efficiency for particles predominantly captured by sieving and other mechanical filtration mechanisms
  • Each zone is manufactured to a given specification, ensuring consistent and reproducible performance
  • Steep efficiency curves result in minimal strip-out of desirable slurry particles while sharply increasing removal of oversized particles

Product Highlights: 

  • Higher performance
  • For fine particle removal
  • Includes multi-zone pore construction
  • Longer service life

Applications/Use

Microelectronics:

  • Semiconductor – CMP

Specifications

Materials
  • Medium: Polypropylene
  • Core, cage, and endcaps: polypropylene
  • O-ring options: ethylene propylene (EPR)
Removal ratings
  • 100 nm
Configurations
  • Nominal length:

             102 mm / 4 in, 254 mm / 10 in, 508 mm / 20 in, 762 mm / 30 in, 1016 mm / 40 in

  • Diameter:

             63 mm / 2.5 in

  • O-ring size / end caps:

             Code 19 (222 double O-ring flat end)

Operating conditions
  • Maximum operating temperature: 
             82°C / 180°F
  • Maximum differential pressure:

            0.41 MPa @ 30°C / 60 psid @ 85°F

            0.34 MPa @ 50°C / 50 psid @ 120°F

            0.2 MPa @ 70°C / 30 psid @ 160°F

            0.1 MPa @ 82°C / 15 psid @ 180°F

Documents

Data Sheets

  • Profile® Nano Filters for CMP Applications

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