Profile® Nano Depth Filter Cartridge

For CMP Applications in Microelectronics

Profile Nano advanced depth filter cartridges are high-performance slurry filters that classify ceria and low solids colloidal silica slurries. They are used in chemical mechanical planarization (CMP) processes such as shallow trench isolation (STI) and barrier copper.

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Availability

In Stock

Product Type

Filter Cartridges

PUY1J025H

Product ID: PUY1J025H
Unit of Measure
1/EA
Min Order Qty
1

CRTG PUY1J100H4

Product ID: PUY1J100H4
Unit of Measure
24/EA
Min Order Qty
24

CRTG PUY1J012J

Product ID: PUY1J012J
Unit of Measure
24/EA
Min Order Qty
24

CRTG PUY1J045J

Product ID: PUY1J045J
Unit of Measure
24/EA
Min Order Qty
24

Ultipleat Profile

Product ID: PUY1U220ZH
Unit of Measure
24/EA
Min Order Qty
24

CRTG PUY1U100ZJ

Product ID: PUY1U100ZJ
Unit of Measure
24/EA
Min Order Qty
24

PUY1UY045H

Product ID: PUY1UY045H
Unit of Measure
1/EA
Min Order Qty
1

Profile® UP Filter Cartridges, 10 in, 40 µm, Ethylene Propylene Rubber

Product ID: PUY1UY400WJ
Unit of Measure
1/EA
Min Order Qty
1
Removal Rating
40 µm
Membrane Material
Polypropylene
Cartridge Length (Imperial)
10 in
Cartridge Length (Metric)
254 mm
Cartridge Length (Metric)
25.4 cm
Gasket / O-Ring Material
Ethylene Propylene Rubber
See All Attributes

CRTG, PUY2J012H13

Product ID: PUY2J012H13
Unit of Measure
1/EA
Min Order Qty
1

CRTG, PUY2J060J

Product ID: PUY2J060J
Unit of Measure
24/EA
Min Order Qty
24

CRTG PUY2J025J

Product ID: PUY2J025J
Unit of Measure
24/EA
Min Order Qty
24

PUY2U220ZJ

Product ID: PUY2U220ZJ
Unit of Measure
1/EA
Min Order Qty
1

Description

Why choose Profile Nano depth filter cartridges for CMP applications?

 

These CMP filters efficiently remove particles as fine as 100 nm with the help of extremely fine fibers manufactured via a highly advanced melt-blowing process.

 

Additional benefits include:

 

  • High removal efficiency for particles predominantly captured by sieving and other mechanical filtration mechanisms
  • Each zone is manufactured to a given specification, ensuring consistent and reproducible performance
  • Steep efficiency curves result in minimal strip-out of desirable slurry particles while sharply increasing removal of oversized particles

Product Highlights: 

  • Higher performance
  • For fine particle removal
  • Includes multi-zone pore construction
  • Longer service life

Applications/Use

Microelectronics:

  • Semiconductor – CMP

Specifications

Materials
  • Medium: Polypropylene
  • Core, cage, and endcaps: polypropylene
  • O-ring options: ethylene propylene (EPR)
Removal ratings
  • 100 nm
Configurations
  • Nominal length:

             102 mm / 4 in, 254 mm / 10 in, 508 mm / 20 in, 762 mm / 30 in, 1016 mm / 40 in

  • Diameter:

             63 mm / 2.5 in

  • O-ring size / end caps:

             Code 19 (222 double O-ring flat end)

Operating conditions
  • Maximum operating temperature: 
             82°C / 180°F
  • Maximum differential pressure:

            0.41 MPa @ 30°C / 60 psid @ 85°F

            0.34 MPa @ 50°C / 50 psid @ 120°F

            0.2 MPa @ 70°C / 30 psid @ 160°F

            0.1 MPa @ 82°C / 15 psid @ 180°F

Documents

Data Sheets

  • Profile® Nano Filters for CMP Applications

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