Profile® Nano Depth Filter Cartridge

For CMP Applications in Microelectronics

Profile Nano advanced depth filter cartridges are high-performance slurry filters that classify ceria and low solids colloidal silica slurries. They are used in chemical mechanical planarization (CMP) processes such as shallow trench isolation (STI) and barrier copper.

Order Products

Brand

Claris®

MPCL 1-30E-FIN

Product ID: MPCL130EFIN
Unit of Measure
12/EA
Min Order Qty
12

MW 20-9.875 827

Product ID: MW209875827
Unit of Measure
72/EA
Min Order Qty
72

MW 5-30 827

Product ID: MW530827
Unit of Measure
24/EA
Min Order Qty
24

MW 1-20 827

Product ID: MW120827
Unit of Measure
48/EA
Min Order Qty
48

CULLIGAN 00955319 885

Product ID: CULLIGAN0095S00005
Unit of Measure
36/EA
Min Order Qty
36

CULLIGAN 00445072 885

Product ID: CULLIGAN0044S00001
Unit of Measure
24/EA
Min Order Qty
24

CULLIGAN 00955318 885

Product ID: CULLIGAN0095S00004
Unit of Measure
36/EA
Min Order Qty
36

CULLIGAN 00955317 885

Product ID: CULLIGAN0095S00002
Unit of Measure
36/EA
Min Order Qty
36

CULLIGAN 00955010 885

Product ID: CULLIGAN0095S00003
Unit of Measure
36/EA
Min Order Qty
36

AVS1M30

Product ID: AVS1M30
Unit of Measure
24/EA
Min Order Qty
24

AVS20M30

Product ID: AVS20M30
Unit of Measure
24/EA
Min Order Qty
24

AVS50M9.75

Product ID: AVS50M975
Unit of Measure
72/EA
Min Order Qty
72

Description

Why choose Profile Nano depth filter cartridges for CMP applications?

 

These CMP filters efficiently remove particles as fine as 100 nm with the help of extremely fine fibers manufactured via a highly advanced melt-blowing process.

 

Additional benefits include:

 

  • High removal efficiency for particles predominantly captured by sieving and other mechanical filtration mechanisms
  • Each zone is manufactured to a given specification, ensuring consistent and reproducible performance
  • Steep efficiency curves result in minimal strip-out of desirable slurry particles while sharply increasing removal of oversized particles

Product Highlights: 

  • Higher performance
  • For fine particle removal
  • Includes multi-zone pore construction
  • Longer service life

Applications/Use

Microelectronics:

  • Semiconductor – CMP

Specifications

Materials
  • Medium: Polypropylene
  • Core, cage, and endcaps: polypropylene
  • O-ring options: ethylene propylene (EPR)
Removal ratings
  • 100 nm
Configurations
  • Nominal length:

             102 mm / 4 in, 254 mm / 10 in, 508 mm / 20 in, 762 mm / 30 in, 1016 mm / 40 in

  • Diameter:

             63 mm / 2.5 in

  • O-ring size / end caps:

             Code 19 (222 double O-ring flat end)

Operating conditions
  • Maximum operating temperature: 
             82°C / 180°F
  • Maximum differential pressure:

            0.41 MPa @ 30°C / 60 psid @ 85°F

            0.34 MPa @ 50°C / 50 psid @ 120°F

            0.2 MPa @ 70°C / 30 psid @ 160°F

            0.1 MPa @ 82°C / 15 psid @ 180°F

Documents

Data Sheets

  • Profile® Nano Filters for CMP Applications

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